Classification of Raman spectroscopy equipment that irradiates laser light onto samples and measures wavelength changes in scattered light due to molecular vibrations to non-destructively analyze molecular structure and crystalline state of materials. Used for crystallinity evaluation of semiconductor materials, stress analysis of metallic materials, molecular structure identification of resins and polymers, film quality evaluation of thin films, and graphitization degree measurement of carbon materials. Plays important roles in quality control, material development, and failure analysis in manufacturing industry, available in forms such as microscopic Raman equipment, portable Raman equipment, and process inline equipment. Differs from infrared spectroscopy and X-ray diffraction equipment in measurement principles and targets, specialized as precision analytical instruments for non-destructive analysis at molecular level.